Environmental and Electrical Testing Services

SMT Corp.’s Electronics Test Lab can perform ISO 17025 accredited electrical testing as part of a component authentication process or as a stand-alone test service. Below is a summary of our capabilities and test equipment.

 A more detailed PDF is available for download at the following link

Electronic component testing equipment
Electronic component hooked up to equipment for testing

In-House AS6081/AS6171 Certified Electrical Testing Lab

  • In-House PCB/Hardware and Software Design​
  • RF Testing (300kHz to 13.5GHz) – Agilent N5231A​
  • High Speed / High Pin Count Digital Devices – Advantest V93000 ATEs​
  • High Current / High Voltage Semiconductor Testing – Keithley 2651A/2657A SMUs​
  • Component Temperature Testing – Temptronics ATS-810 (-80°C to +225°C)
  • Memory Blank Checking and Programming​
  • Component Up-Screening ​
  • MIL-STD-883 Static and Dynamic Burn-In​
  • MIL-STD-883 Temperature Cycling​

MIL-STD-750 and MIL-STD-883

SMT Corp can now support screening and testing of microcircuits and discrete semiconductor components in accordance with military standard test methods, MIL-STD-883 and MIL-STD-750.

Based on the implementation of these testing methods, SMT Corp can provide screening as defined by MIL-PRF-19500, MIL-PRF-38534, MIL-PRF-38535.

Defense and Aerospace Electronic Component Testing Services
Hands of lab technician at work on electrical component
Lab tech at work testing an electrical component
Experts performing AS6171 testing

In-House Design

  • PCB/Hardware
  • Software Development

Passive Components

  • FrequencyRange: 10Hz to 120MHz
  • Resistance, Capacitance, Inductance, Impedance, Q Factor.
  • Surface Mount Fixtures: Chip (0201 to 1206), Tweezer (0402 and larger)
  • Through Hole Fixtures (Alligator Clips, Radial Lead)

RF

  • FrequencyRange: 300kHz to 13GHz Frequency Range 
  • Device Examples:
    1. MMICs, Power Amplifiers, Filters, Multiplexers, Quadrature Modulators

 Discrete Semiconductors

  • 3000V to 50A testing capability
  • ~1pA current measurement capability
  • DC and Pulse (300µs) capability
  • Lecroy WavePro 7300 Oscilloscopes – 3GHz Bandwidth for timing measurements

  Environmental Testing

  • Burn-in testing per MIL-STD-883 Test Method 1015 (Static and Dynamic)
  • Temperature Cycling per MIL-STD-883 Test Method 1010

Memory Blank Checking and Programming

 Integrated Circuits (Small and Large Scale)

  • National Instruments PXIe 6555/6556 – 200MHz up to 192 Channels
  • National Instruments PXIe 4 Channel SMUs (±6V to ±24V, ±500mA to ±150mA)
  • Lecroy WavePro 7300 Oscilloscopes – 3GHz Bandwidth for timing measurements
  • Advantest V93000 – 1.6Gbs Data Rate, 512 Channels (Upgradable to 2048 Channels)
  • Device Examples:
    1. DRAM (SDRAM, DDR, DDR2, DDR3, DDR4)
    2. Flash (NOR, NAND, SPI, I2C, PROM, EPROM)
    3. SRAM
    4. FPGAs
    5. Microprocessors
    6. Microcontrollers
    7. 5962 Microcircuits
    8. Logic
    9. Analog (Multiplexers, Op Amps, Voltage Regulators, ADC/DAC, ect)

Interested to learn more about these additional services? 

Reach out to a member of SMT Corp to further discuss our electrical testing capabilities.

Contact Us