X-ray fluorescence (XRF) is a nondestructive method used for chemical elemental analysis of materials in the solid or liquid state. The specimen is irradiated by photons or charged particles of sufficient energy to cause its elements to emit (fluoresce) their characteristic x-ray line spectra. The detection system allows the determination of the energies of the emitted lines and their intensities. Elements in the specimen are identified by their spectral line energies or wavelengths for qualitative analysis, and the intensities are related to their concentrations for quantitative analysis.

On July 1st, 2006, the European Union began enforcing a directive on the restriction of using certain hazardous substances in electrical and electronic equipment. The Restriction of Hazardous Substances Directive, or commonly known by the acronym RoHS, restricts the use of six different hazardous materials in the manufacturing process for electronic and electrical equipment. These substances are:

  • Lead (Pb)
  • Mercury (Hg)
  • Cadmium (Cd)
  • Chromium (Cr)
  • Bromine Compounds (Br)

SMT Corp uses three X-Ray Fluorescence (XRF) testers - two XDAL systems manufactured by Fischerscope and one by Innovox to perform testing for RoHS compliance, lead content in solder platings, overall elemental spectral analysis, and plating thickness. This system fastidiously identifies coatings and base metals within the component determining its alloy or elemental composition. XRF test results from our Fischer XDAL systems is included with all Defense & Aerospace application orders sourced from the open market.

Sample of Test Data Obtained:

  • Photo-documented sampling location
  • Elemental composition data
  • Spectral analaysis data


Innov·X Custom XRF Table
Fischerscope XDAL